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Improve Productivity at the HW/SW Interface

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Shop Talk: Tuesday, April 27
Smart Grid Implementation to Intrusion Speaker: Allan Yogasingam, Editor, EE Times Products, EE Times Group Time: 7:00am — 8:00am Abstract: Has anyone thought of the smart grid as an invasion of privacy? Is the amount of information that will be shared with respect to the individual's energy habits be used against the individual? Should this information be shared openly or do Americans deserve the right to energy privacy? The current systems that will be used to implement the Smart Grid are technologies like WiFi, ZigBee, and Bluetooth. Technologies that, at times, have shown an unreliability to protect secure information. Will this technology employed also jeopardize the security of this information?

Shop Talk: Tuesday, April 27

Smart Grid Implementation to Intrusion
Speaker: Allan Yogasingam, Editor, EE Times Products, EE Times Group
Time: 7:00am — 8:00am
Abstract: Has anyone thought of the smart grid as an invasion of privacy? Is the amount of information that will be shared with respect to the individual's energy habits be used against the individual? Should this information be shared openly or do Americans deserve the right to energy privacy? The current systems that will be used to implement the Smart Grid are technologies like WiFi, ZigBee, and Bluetooth. Technologies that, at times, have shown an unreliability to protect secure information. Will this technology employed also jeopardize the security of this information?

Shop Talk: Wednesday, April 28
Bring Your Test Challenge to the Test Experts Speaker: Gina Bonini, Technical Marketing Manager, Tektronix, Inc. Time: 7:00am — 8:00am Key Takeaways: Consult with the Tektronix Test Experts on your most challenging test issue. Abstract: Do you have a tough test problem, something that has you stumped? Let our experts help you out. We'll be on hand to discuss the test challenges you are facing, armed with a few of our scopes, including our DPO7000 for in-depth characterization and compliance testing, and our MSO4000 for all-around debug. Potential problems could include analyzing switch-mode power supply performance, DDR memory validation, analysis of serial and parallel buses including USB2.0, and system-level troubleshooting. In addition, one lucky attendee will walk away with a free DMM4050 digital multimeter. The DMM4050 offers 6.5 digit resolution with 0.0024% basic VDC accuracy.

Shop Talk: Wednesday, April 28

Bring Your Test Challenge to the Test Experts
Speaker: Gina Bonini, Technical Marketing Manager, Tektronix, Inc.
Time: 7:00am — 8:00am
Key Takeaways: Consult with the Tektronix Test Experts on your most challenging test issue.
Abstract: Do you have a tough test problem, something that has you stumped? Let our experts help you out. We'll be on hand to discuss the test challenges you are facing, armed with a few of our scopes, including our DPO7000 for in-depth characterization and compliance testing, and our MSO4000 for all-around debug. Potential problems could include analyzing switch-mode power supply performance, DDR memory validation, analysis of serial and parallel buses including USB2.0, and system-level troubleshooting. In addition, one lucky attendee will walk away with a free DMM4050 digital multimeter. The DMM4050 offers 6.5 digit resolution with 0.0024% basic VDC accuracy.